𝔖 Bobbio Scriptorium
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Image formation in photosensitive layers on top of highly conductive substrates

✍ Scribed by van den Berg, H. A. M.; Zieren, V.

Book ID
115384883
Publisher
Optical Society of America
Year
1980
Weight
876 KB
Volume
70
Category
Article
ISSN
0030-3941

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Formation of dislocation structure in si
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## Abstract A dislocation structure of Si layers crystallized from a floating grain on quartz glass and mullite ceramics substrates has been investigated by transmission electron microscopy (TEM) including the high‐voltage one. The effect of the layer orientation on the crystallographic features of