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Image force effects in electron microscopy

✍ Scribed by P.M. Echenique; A. Howie

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 236 KB
Volume: 16
Category: Article
ISSN: 0304-3991
DOI: 10.1016/0304-3991(85)90082-8

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