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IIIB-6 analysis of current transport and charge trapping in ultrathin nitrided oxide MIS capacitors

✍ Scribed by Chang, S.T.; Lyon, S.A.; Johnson, N.M.


Book ID
114594982
Publisher
IEEE
Year
1984
Tongue
English
Weight
166 KB
Volume
31
Category
Article
ISSN
0018-9383

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