IIIB-4 noise associated with substrate current in fine-line NMOS field-effect transistors

✍ Scribed by Jindal, R.P.

• Book ID: 114594978
• Publisher: IEEE
• Year: 1984
• Tongue: English
• Weight: 164 KB
• Volume: 31
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1984.21850