✦ LIBER ✦
IIIB-3 scattering analysis of low surface-effective-field mobility degradation in sub-100Å gate oxide MOSFETS
✍ Scribed by Moore, B.T.; Mize, J.P.; Yu-Pin Han; Pinto, J.; Worley, R.
- Book ID
- 114594573
- Publisher
- IEEE
- Year
- 1983
- Tongue
- English
- Weight
- 197 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0018-9383
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