IIIB-2 Channel length characterization of LDD MOSFET's

✍ Scribed by Sun, J.Y.C.; Wordeman, M.R.; Laux, S.E.

• Book ID: 114595379
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 342 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1985.22332