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IIIA-7 measurement of high electron drift velocity in a submicron heavily doped graded GAP AlxGa1-xAs layer

✍ Scribed by Levine, B.F.; Bethea, C.G.; Tsang, W.T.; Capasso, F.; Thornber, K.K.; Fulton, R.C.


Book ID
114594569
Publisher
IEEE
Year
1983
Tongue
English
Weight
199 KB
Volume
30
Category
Article
ISSN
0018-9383

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