IIB-2 a new method to measure very low bulk trap densities in silicon

✍ Scribed by Collet, M.G.

• Book ID: 114591970
• Publisher: IEEE
• Year: 1975
• Tongue: English
• Weight: 185 KB
• Volume: 22
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1975.18287