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[IET International Technology and Innovation Conference 2009 (ITIC 2009) - Xi'an, China (12-14 Oct. 2009)] International Technology and Innovation Conference 2009 (ITIC 2009) - Research on reliability modeling of complex system based on dynamic fault tree

✍ Scribed by Yuan Jing, ; Long Yong, ; Li Yanling, ; Xu Rui,

Book ID: 121882845
Publisher: IET
Year: 2009
Weight: 128 KB
Category: Article
DOI: 10.1049/cp.2009.1515

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