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[IET IET 8th International Conference on Computation in Electromagnetics (CEM 2011) - Wroclaw, Poland (11-14 April 2011)] IET 8th International Conference on Computation in Electromagnetics (CEM 2011) - Two-level approach for solving the inverse problem of defect identification in eddy current testing-type NDT

✍ Scribed by Putek, P.; Crevecoeur, G.; Slodicka, M.; Gawrylczyk, K.; van Keer, R.; Dupre, L.

Book ID: 120205047
Publisher: IET
Year: 2011
Weight: 197 KB
Category: Article
ISBN: 1849194688
DOI: 10.1049/cp.2011.0071

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