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[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - Radiation design test data for advanced CMOS product

✍ Scribed by Maher, M.C.

Book ID: 126694464
Publisher: IEEE
Year: 1992
Weight: 676 KB
Category: Article
ISBN-13: 9780780309302
DOI: 10.1109/REDW.1992.247323

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