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[IEEE Twenty Fourth IEEE/CPMT International Electronics Manufacturing Technology Symposium - Austin, TX, USA (18-19 Oct. 1999)] Twenty Fourth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.99CH36330) - Effect of CSP rework on surface intermetallic growth

✍ Scribed by Philpott, J.D.; Nguty, T.A.; Ekere, N.N.; Jones, G.D.

Book ID: 124072409
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 760 KB
Category: Article
ISBN-13: 9780780355026
DOI: 10.1109/IEMT.1999.804809

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