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[IEEE Twenty-First Annual IEEE Applied Power Electronics Conference and Exposition, 2006. APEC '06. - USA (March 19, 2006)] Twenty-First Annual IEEE Applied Power Electronics Conference and Exposition, 2006. APEC '06. - Impact of Gate Voltage Bias on Reverse Recovery Losses of Power MOSFETs

✍ Scribed by Elferich, R.; Lopez, T.

Book ID: 118019538
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 679 KB
Volume: 0
Category: Article
ISBN-13: 9780780395473
DOI: 10.1109/apec.2006.1620721

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