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[IEEE Twenty-First Annual IEEE Applied Power Electronics Conference and Exposition, 2006. APEC '06. - USA (March 19, 2006)] Twenty-First Annual IEEE Applied Power Electronics Conference and Exposition, 2006. APEC '06. - Characterization of SiC Diodes in Extremely High Temperature Ambient

✍ Scribed by Funaki, T.; Kashyap, A.S.; Mantooth, H.A.; Balda, J.C.; Barlow, F.D.; Kimoto, T.; Hikihara, T.

Book ID: 118019536
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 570 KB
Volume: 0
Category: Article
ISBN-13: 9780780395473
DOI: 10.1109/apec.2006.1620575

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