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[IEEE Third International IEEE Workshop on Software Evolvability 2007 - Paris, France (2007.10.1-2007.10.1)] Third International IEEE Workshop on Software Evolvability 2007 - Enhancing Software Evolution through Design Pattern Detection

✍ Scribed by Arcelli, Francesca; Christina, Luca

Book ID: 126760260
Publisher: IEEE
Year: 2007
Weight: 432 KB
Category: Article
ISBN-13: 9780769530024
DOI: 10.1109/SE.2007.11

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