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[IEEE Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) - Kuala Lumpur, Malaysia (2006.01.17-2006.01.19)] Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) - Random sampling algorithm in RFID indoor location system

✍ Scribed by Bao Xu, ; Wang Gang,

Book ID: 115447167
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 216 KB
Volume: 0
Category: Article
ISBN-13: 9780769525006
DOI: 10.1109/delta.2006.73

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