[IEEE Third IEEE International Vacuum Electronics Conference - Monterey, CA, USA (23-25 April 2002)] Third IEEE International Vacuum Electronics Conference (IEEE Cat. No.02EX524) - A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST MICROWAVE STUDIO and MAFIA

✍ Scribed by Chevalier, C.T.; Herrmann, K.A.; Kory, C.L.; Wilson, J.D.; Cross, A.W.

• Book ID: 118020323
• Publisher: IEEE
• Year: 2002
• Weight: 323 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780372566
• DOI: 10.1109/ivelec.2002.999236