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[IEEE The European Conference on Wireless Technology, 2005. - CNIT la Defense, Paris (Oct. 3-4, 2005)] The European Conference on Wireless Technology, 2005. - Noise Analysis of ESD Structures and Impacts on a Fully-Integrated 5.5GHz LNA in 0.18(mu)m SiGe BiCMOS

✍ Scribed by Guang Chen, ; Haigang Feng, ; Wang, A.; Yuhua Cheng,

Book ID: 121341032
Publisher: IEEE
Year: 2005
Weight: 179 KB
Category: Article
ISBN-13: 9782960055115
DOI: 10.1109/ECWT.2005.1617707

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