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[IEEE the American Electromagnetics Conference (AMEREM) - Ottawa, ON, Canada (2010.07.5-2010.07.8)] 2010 14th International Symposium on Antenna Technology and Applied Electromagnetics & the American Electromagnetics Conference - Design, fabrication, and characterization of ultra-wide band TEM horn for microwave imaging

✍ Scribed by Amineh, Reza K.; Nikolova, Natalia K.

Book ID: 117995155
Publisher: IEEE
Year: 2010
Weight: 786 KB
Volume: 0
Category: Article
ISBN: 1424450497
DOI: 10.1109/antem.2010.5552478

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