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[IEEE The 3rd International IEEE-NEWCAS Conference, 2005. - Quebec City, Canada (19-22 June, 2005)] The 3rd International IEEE-NEWCAS Conference, 2005. - Substrate Noise Coupling Effect Characterization-for RF CMOS LC VCOs

✍ Scribed by Magierowski, S.; Iniewski, K.; Siu, C.

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