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[IEEE Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Windsor, UK (29-31 Aug. 2006)] Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06) - TRex - The Refactoring and Metrics Tool for TTCN-3 Test Specifications

✍ Scribed by Baker, P.; Evans, D.; Grabowski, J.; Neukirchen, H.; Zeiss, B.

Book ID: 127081784
Publisher: IEEE
Year: 2006
Weight: 257 KB
Category: Article
ISBN-13: 9780769526720
DOI: 10.1109/taic-part.2006.35

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