[IEEE Tenth IEEE International High-Level Design Validation and Test Workshop, 2005. - Napa Valley, CA, USA (Nov. 30-Dec. 2, 2005)] Tenth IEEE International High-Level Design Validation and Test Workshop, 2005. - Improvement of fault injection techniques based on VHDL code modification

✍ Scribed by Baraza, J.C.; Gracia, J.; Gil, D.; Gil, P.J.

• Book ID: 121661565
• Publisher: IEEE
• Year: 2005
• Weight: 557 KB
• Category: Article
• ISBN-13: 9780780395718
• DOI: 10.1109/HLDVT.2005.1568808