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[IEEE Tenth Asian Test Symposium - Kyoto, Japan (19-21 Nov. 2001)] Proceedings 10th Asian Test Symposium - Multiple attractor cellular automata for hierarchical diagnosis of VLSI circuits

✍ Scribed by Sikdar, B.K.; Ganguly, N.; Karmakar, A.; Chowdhury, S.S.; Chaudhuri, P.P.

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