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[IEEE Tenth Asian Test Symposium - Kyoto, Japan (19-21 Nov. 2001)] Proceedings 10th Asian Test Symposium - Detecting unique faults in multi-port SRAMs

✍ Scribed by Hamdioui, S.; Van de Goor, A.J.; Eastwick, D.; Rodgers, M.

No coin nor oath required. For personal study only.

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