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[IEEE Telecommunication Technology" (CriMiCo 2008) - Sevastopol, Ukraine (2008.09.8-2008.09.12)] 2008 18th International Crimean Conference - Microwave & Telecommunication Technology - Semiconductor surface quality influence on MESFET’s parameters

✍ Scribed by Martynov, Y. B.; Pogorelova, E. W.

Book ID: 126728206
Publisher: IEEE
Year: 2008
Weight: 237 KB
Category: Article
ISBN: 9663351667
DOI: 10.1109/CRMICO.2008.4676329

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