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[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Tozeur, Tunisia (2008.03.25-2008.03.27)] 2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era - Structural and electrical characterization of carbon nanotube field-effect transistors fabricated by novel self-aligned growth method

✍ Scribed by Rispal, Lorraine; Schwalke, Udo

Book ID: 120266781
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 979 KB
Category: Article
ISBN: 1424415764
DOI: 10.1109/DTIS.2008.4540244

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