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[IEEE Technical Digest of the 18th International Vacuum Nanoelectronics Conference - Oxford, UK (10-14 July 2005)] 2005 International Vacuum Nanoelectronics Conference - Theoretical analysis of triple junction field emission for a new type of cold cathode

✍ Scribed by Chung, M.S.; Choi, T.S.; Cutler, P.H.; Miskovsky, N.M.

Book ID: 120637225
Publisher: IEEE
Year: 2005
Weight: 543 KB
Category: Article
ISBN-13: 9780780383975
DOI: 10.1109/IVNC.2005.1619514

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