[IEEE Technical Digest., International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1988)] Technical Digest., International Electron Devices Meeting - An accurate model of subbreakdown due to band-to-band tunneling and its application

✍ Scribed by Shirota, R.; Endoh, T.; Momodomi, M.; Nakayama, R.; Inoue, S.; Kirisawa, R.; Masuoka, F.

• Book ID: 126652007
• Publisher: IEEE
• Year: 1988
• Weight: 195 KB
• Category: Article
• DOI: 10.1109/IEDM.1988.32741