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[IEEE SICE 2008 - 47th Annual Conference of the Society of Instrument and Control Engineers of Japan - Chofu (2008.08.20-2008.08.22)] 2008 SICE Annual Conference - Temperature measurement using fluorescence image

✍ Scribed by Katsumata, T.; Aizawa, H.; Komuro, S.

No coin nor oath required. For personal study only.

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