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[IEEE Seventh IEEE International Conference on Data Mining (ICDM 2007) - Omaha, NE, USA (2007.10.28-2007.10.31)] Seventh IEEE International Conference on Data Mining (ICDM 2007) - Mining Statistical Information of Frequent Fault-Tolerant Patterns in Transactional Databases

✍ Scribed by Poernomo, Ardian Kristanto; Gopalkrishnan, Vivekanand

Book ID: 120021509
Publisher: IEEE
Year: 2007
Weight: 489 KB
Category: Article
ISBN-13: 9780769530185
DOI: 10.1109/ICDM.2007.48

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