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[IEEE Seventh Biennial IEEE International Nonvolatile Memory Technology Conference. Proceedings - Albuquerque, NM, USA (22-24 June 1998)] Seventh Biennial IEEE International Nonvolatile Memory Technology Conference. Proceedings (Cat. No.98EX141) - Investigation of tunneling current through thin dielectrics

✍ Scribed by Evtukh, A.A.; Litovchenko, V.G.; Kizijak, A.Yu.

Book ID: 126763828
Publisher: IEEE
Year: 1998
Weight: 375 KB
Category: Article
ISBN-13: 9780780345188
DOI: 10.1109/NVMT.1998.723234

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