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[IEEE Second International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE'07) - Bell Harbor, WA, USA (2007.04.10-2007.04.12)] Second International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE'07) - Real-World Implications of Digital Forensics: Technical, Methodological&Procedural Hurdles

✍ Scribed by Attfield, Philip; Schroeder, Stephen

Book ID: 126616808
Publisher: IEEE
Year: 2007
Weight: 107 KB
Category: Article
ISBN-13: 9780769528083
DOI: 10.1109/SADFE.2007.15

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