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[IEEE Second International Workshop on Automation of Software Test (AST '07) - Minneapolis, MN, USA (2007.05.20-2007.05.26)] Second International Workshop on Automation of Software Test (AST '07) - Coverage-Based Testing on Embedded Systems

✍ Scribed by Wu, X.; Li, J. Jenny; Weiss, D.; Lee, Y.

Book ID: 121220269
Publisher: IEEE
Year: 2007
Weight: 283 KB
Category: Article
DOI: 10.1109/AST.2007.8

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