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[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Thermal and field dependencies of latent relaxation processes in irradiated MOS devices

✍ Scribed by Emelianov, V.V.; Sogoyan, A.V.; Cherepko, S.V.; Meshurov, O.V.; Ulimov, V.N.; Chumakov, A.I.; Rogov, V.I.; Nikiforov, A.Y.

Book ID: 120910185
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 424 KB
Category: Article
ISBN-13: 9780780340718
DOI: 10.1109/RADECS.1997.698843

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