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[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - A methodology study lateral parasitic transistors in CMOS technologies

✍ Scribed by Flament, O.; Chabrerie, C.; Ferlet-Cavrois, V.; Leray, J.L.; Faccio, F.; Jarron, P.

Book ID: 120879392
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 509 KB
Category: Article
ISBN-13: 9780780340718
DOI: 10.1109/RADECS.1997.698845

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