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[IEEE . RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems - La Grande-Motte, France (9-12 Sept. 1991)] . RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems - Single event upset error propagation between interconnected VLSI logic devices

✍ Scribed by Newberry, D.M.

Book ID: 125844131
Publisher: IEEE
Year: 1992
Weight: 323 KB
Category: Article
ISBN-13: 9780780302082
DOI: 10.1109/RADECS.1991.213553

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