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[IEEE Proceedings., Second International Conference on Properties and Applications of Dielectric Materials - Beijing, China (12-16 Sept. 1988)] Proceedings., Second International Conference on Properties and Applications of Dielectric Materials - Measurement of the loss tangent of single crystals of CaF/sub 2/ and of LiF with a new highly sensitive loss tangent bridge

✍ Scribed by Kwaaitaal, T.; van der Eijnden, W.M.M.M.

Book ID: 126669943
Publisher: IEEE
Year: 1988
Weight: 300 KB
Category: Article
DOI: 10.1109/ICPADM.1988.38372

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