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[IEEE Proceedings., Second International Conference on Properties and Applications of Dielectric Materials - Beijing, China (12-16 Sept. 1988)] Proceedings., Second International Conference on Properties and Applications of Dielectric Materials - High-voltage field testing of GIS from a physical view-point

✍ Scribed by Haller, R.; Hauschild, W.; Mosch, W.

Book ID: 126556038
Publisher: IEEE
Year: 1988
Weight: 301 KB
Category: Article
DOI: 10.1109/ICPADM.1988.38508

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