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[IEEE Proceedings of the IEEE Sixth Working Conference on Current Measurement (Cat. No.99CH36331) - San Diego, CA, USA (1999.03.13-1999.03.13)] Proceedings of the IEEE Sixth Working Conference on Current Measurement (Cat. No.99CH36331) - Current profiling algorithms for highest accuracy and maximum depth

✍ Scribed by Christensen, J.L.; Hess, R.D.

Book ID: 126675868
Publisher: IEEE
Year: 1999
Weight: 245 KB
Category: Article
ISBN-13: 9780780355057
DOI: 10.1109/CCM.1999.755250

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