𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - Seattle, WA, USA (20-23 Sept. 2004)] Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - An evaluation method of the contact erosion based on the DC mode test of electromagnetic contactor

✍ Scribed by Kawakami, Y.; Takashima, M.; Hasegawa, M.; Watanabe, Y.; Sawa, K.

Book ID: 121243188
Publisher: IEEE
Year: 2004
Weight: 573 KB
Category: Article
ISBN-13: 9780780384606
DOI: 10.1109/HOLM.2004.1353099

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Proceedings of the 50th IEEE Holm

[IEEE Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - Seattle, WA, USA (20-23 Sept. 2004)] Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - On the arcless commutation of currents higher than 1kA

✍ Niayesh, K.; Tepper, J.; Konig, F. 📂 Article 📅 2004 🏛 IEEE ⚖ 576 KB

[IEEE Proceedings of the 50th IEEE Holm

[IEEE Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - Seattle, WA, USA (20-23 Sept. 2004)] Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - Simulation of the temporal behavior of circuit breakers and motor starters

✍ Stammberger, H.; Pursch, H.; Zacharias, A.; Terhoeven, P. 📂 Article 📅 2004 🏛 IEEE ⚖ 381 KB

[IEEE Proceedings of the 50th IEEE Holm

[IEEE Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - Seattle, WA, USA (20-23 Sept. 2004)] Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - "Electrical arc phenomena and its interaction on contact material at 42 volts DC for automotive applications"

✍ Doublet, L.; Jemaa, N.B.; Hauner, F.; Jeannot, D. 📂 Article 📅 2004 🏛 IEEE ⚖ 616 KB

[IEEE Proceedings of the 50th IEEE Holm

[IEEE Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - Seattle, WA, USA (20-23 Sept. 2004)] Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - Micro-arcing and arc erosion minimisation using a 42 volt DC hybrid switching devices

✍ Swingler, J.; McBride, J.W. 📂 Article 📅 2004 🏛 IEEE ⚖ 974 KB

[IEEE Proceedings of the 50th IEEE Holm

[IEEE Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - Seattle, WA, USA (20-23 Sept. 2004)] Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - A study on transmission characteristic of signal line with solder-mount on a PCB

✍ Inoue, H.; Takahashi, K. 📂 Article 📅 2004 🏛 IEEE ⚖ 497 KB

[IEEE Proceedings of the 50th IEEE Holm

[IEEE Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - Seattle, WA, USA (20-23 Sept. 2004)] Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. - Commutation process in gas circuit breakers: close-operation and commutation failure during an open-operation

✍ Schoenemann, T.; Kiefer, J.; Leung, S.-Y.; Oerzen, B.; Inkinen, T.; Huguenot, P. 📂 Article 📅 2004 🏛 IEEE ⚖ 354 KB