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[IEEE Proceedings of the 45th IEEE Conference on Decision and Control - San Diego, CA, USA (2006.12.13-2006.12.15)] Proceedings of the 45th IEEE Conference on Decision and Control - LMI-based Lipschitz Observer Design with Application in Fault Diagnosis

✍ Scribed by Pertew, A. M.; Marquez, H. J.; Zhao, Q.

Book ID: 121839615
Publisher: IEEE
Year: 2006
Weight: 183 KB
Category: Article
ISBN-13: 9781424401710
DOI: 10.1109/CDC.2006.377204

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