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[IEEE Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference - Como, Italy (18-20 May 2004)] Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) - Determination of the thickness and dielectric constant of a dielectric slab backed by free-space or a conductor through inversion of the reflection coefficient of a rectangular waveguide probe

✍ Scribed by Lai, J.; Hughes, D.; Gallaher, E.; Zoughi, R.

Book ID: 127338181
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 313 KB
Category: Article
ISBN-13: 9780780382480
DOI: 10.1109/imtc.2004.1350994

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