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[IEEE Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference - Como, Italy (18-20 May 2004)] Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) - A study of the deviations in thickness as detected by a laser measuring instrument in a stainless steel production line

✍ Scribed by Spinola, C.; Bonelo, J.M.; Martin-Perez, C.; Vizoso, J.

Book ID: 121755115
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 381 KB
Category: Article
ISBN-13: 9780780382480
DOI: 10.1109/IMTC.2004.1351238

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