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[IEEE Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference - Como, Italy (18-20 May 2004)] Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) - Determination of dielectric property profile in cement-based materials using microwave reflection and transmission properties

✍ Scribed by Akuthota, B.; Zoughi, R.; Kurtis, K.E.

Book ID: 120994921
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 290 KB
Category: Article
ISBN-13: 9780780382480
DOI: 10.1109/IMTC.2004.1351056

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