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[IEEE Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference - Como, Italy (18-20 May 2004)] Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) - Improved trade-off between noise and bandwidth in op-amp based transimpedance amplifier

✍ Scribed by Ciofi, C.; Crupi, F.; Pace, C.; Scandurra, G.

Book ID: 118067693
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 231 KB
Volume: 0
Category: Article
ISBN-13: 9780780382480
DOI: 10.1109/imtc.2004.1351478

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