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[IEEE Proceedings of the 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2004. CVPR 2004. - Washington, DC, USA (27 June - 2 July 2004)] Proceedings of the 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2004. CVPR 2004. - Visual odometry

✍ Scribed by Nister, D.; Naroditsky, O.; Bergen, J.

Book ID: 120828988
Publisher: IEEE
Year: 2004
Weight: 548 KB
Volume: 1
Category: Article
ISBN-13: 9780769521589
DOI: 10.1109/CVPR.2004.1315094

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