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[IEEE Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting BIPOL-93 - Minneapolis, MN, USA (1994.10.10-1994.10.11)] Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting BIPOL-93 - The effect of thermal shunt on the current instability of multiple-emitter-finger heterojunction bipolar transistors

✍ Scribed by Liou, ; Bayraktaroglu, ; Huang, ; Barrette,

Book ID: 126627342
Publisher: IEEE
Year: 1993
Weight: 427 KB
Category: Article
ISBN-13: 9780780313163
DOI: 10.1109/BIPOL.1993.617510

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