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[IEEE Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Grenoble, France (12-16 Sept. 2005)] Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Modeling mosfet and circuit degradation through spice

✍ Scribed by Cester, A.; Gerardin, S.; Paccagnella, A.; Ghidini, G.

Book ID: 121476817
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 427 KB
Category: Article
ISBN-13: 9780780392038
DOI: 10.1109/ESSDER.2005.1546670

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