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[IEEE Proceedings Electrical Overstress/Electrostatic Discharge Symposium - Orlando, FL, USA (1997.09.25-1997.09.25)] Proceedings Electrical Overstress/Electrostatic Discharge Symposium - Study Of The ESD Behavior Of Different Clamp Configurations In A 0.35/spl mu/m Cmos Technology

✍ Scribed by Richier, C.; Maene, N.; Mabboux, G.; Bellens, R.

Book ID: 121476816
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 620 KB
Category: Article
ISBN-13: 9781878303691
DOI: 10.1109/EOSESD.1997.634248

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