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[IEEE Proceedings: Electrical Insulation Conference and Electrical Manufacturing and Coil Winding Conference - Cincinnati, OH, USA (26-28 Oct. 1999)] Proceedings: Electrical Insulation Conference and Electrical Manufacturing and Coil Winding Conference (Cat. No.99CH37035) - Statistical and topological characterization of PD defects

✍ Scribed by Paithankar, A.A.; Mokashi, A.D.; Singh, N.M.

Book ID: 120232119
Publisher: IEEE
Year: 1999
Weight: 364 KB
Category: Article
ISBN-13: 9780780357570
DOI: 10.1109/EEIC.1999.826264

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